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3.Silicon wafer
Detectable products:Monocrystalline silicon, polycrystalline silicon, silicon rod.
Detectable types of defects:surface dimension line mark, warpage, chipping, surface defect, crack, perforation, dirt, grid line break, paste stains, color deviation, etc.
Backgrounds:
In the photovoltaic industry, more and more attention is paid to how to ensure the quality of silicon wafers. The internal defects and impurities of silicon wafers will directly affect the efficiency and stability of cells. On the other hand, the appearance defects and surface quality of silicon wafers will also have a direct effect on the manufacturing of cells. Using visual inspection technology to replace manual inspection can improve inspection accuracy and reduce labor costs.
Detectable products:
Monocrystalline silicon, polycrystalline silicon, silicon rod.
Detectable types of defects:
surface dimension line mark, warpage, chipping, surface defect, crack, perforation, dirt, grid line break, paste stains, color deviation, etc.
Values:
In the photovoltaic industry, more and more attention is paid to how to ensure the quality of silicon wafers. The internal defects and impurities of silicon wafers will directly affect the efficiency and stability of cells. On the other hand, the appearance defects and surface quality of silicon wafers will also have a direct effect on the manufacturing of cells. Using visual inspection technology to replace manual inspection can improve inspection accuracy and reduce labor costs.
Detectable products:
Monocrystalline silicon, polycrystalline silicon, silicon rod.
Detectable types of defects:
surface dimension line mark, warpage, chipping, surface defect, crack, perforation, dirt, grid line break, paste stains, color deviation, etc.
Values:
1.Replace labor, greatly improve efficiency, and reduce labor costs.
2.User-friendly and stable operating system.
3.Defects database, realization of smart data analysis.
